IDENTIFICATION OF TRANSFORMER INRUSH CURRENT USING MORPHOLOGICAL SIGNAL DECOMPOSITION
专家论坛专题报告电力市场学术研究|更新时间:2025-08-13
|
IDENTIFICATION OF TRANSFORMER INRUSH CURRENT USING MORPHOLOGICAL SIGNAL DECOMPOSITION
暂无标题
电力系统自动化2002年26卷第24期
作者机构:
作者简介:
基金信息:
DOI:
中图分类号:
纸质出版日期:2002
稿件说明:
移动端阅览
IDENTIFICATION OF TRANSFORMER INRUSH CURRENT USING MORPHOLOGICAL SIGNAL DECOMPOSITION[J]. 电力系统自动化, 2002,26(24).
IDENTIFICATION OF TRANSFORMER INRUSH CURRENT USING MORPHOLOGICAL SIGNAL DECOMPOSITION[J]. 电力系统自动化, 2002,26(24).DOI:
DOI:
IDENTIFICATION OF TRANSFORMER INRUSH CURRENT USING MORPHOLOGICAL SIGNAL DECOMPOSITION
摘要
Based on Mathematical Morphology (MM)
this paper presents a new method for discrimination between internal fault and magnetising inrush conditions for power transformer protection. The proposed algorithm is to decompose the signal with a class of morphologically simple function
known as Blum functions
to allow the unique feature associated with the inrush current waveform to be preserved
while suppressing other irrelevant features. The proposed scheme has been applied to simulated signals generated by PSCAD/EMTDC. The results confirm that features extracted by the MM filtering have a distinctive property
on which simple identification criteria can be applied for detecting an inrush current from internal fault conditions.
Abstract
Based on Mathematical Morphology (MM)
this paper presents a new method for discrimination between internal fault and magnetising inrush conditions for power transformer protection. The proposed algorithm is to decompose the signal with a class of morphologically simple function
known as Blum functions
to allow the unique feature associated with the inrush current waveform to be preserved
while suppressing other irrelevant features. The proposed scheme has been applied to simulated signals generated by PSCAD/EMTDC. The results confirm that features extracted by the MM filtering have a distinctive property
on which simple identification criteria can be applied for detecting an inrush current from internal fault conditions.