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电力传输与功率变换控制教育部重点实验室(上海交通大学),上海市 200240
Received:10 March 2022,
Revised:2022-08-11,
Published Online:31 January 2023,
Published:10 March 2023
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李咏秋,徐晋,汪可友等.小型固态变压器状态监测及单管开路故障诊断数字孪生方法[J].电力系统自动化,2023,47(5):153-161.
LI Yongqiu,XU Jin,WANG Keyou,et al.Digital Twin Method for State Monitoring and Single-tube Open-circuit Fault Diagnosis of Small Solid-state Transformer[J].Automation of Electric Power Systems,2023,47(5):153-161.
李咏秋,徐晋,汪可友等.小型固态变压器状态监测及单管开路故障诊断数字孪生方法[J].电力系统自动化,2023,47(5):153-161. DOI: 10.7500/AEPS20220310003.
LI Yongqiu,XU Jin,WANG Keyou,et al.Digital Twin Method for State Monitoring and Single-tube Open-circuit Fault Diagnosis of Small Solid-state Transformer[J].Automation of Electric Power Systems,2023,47(5):153-161. DOI: 10.7500/AEPS20220310003.
固态变压器作为能源路由器的重要实现形式,在交直流配电网、微电网的能量分配与控制等方面具有广阔应用前景。为提高固态变压器运行稳定性,克服固态变压器“多器件”状态监测及“多开关”开路故障定位难题,利用数字孪生的高保真性与互操作性,提出小型固态变压器状态监测及单管开路故障诊断数字孪生方法。该方法利用电磁暂态程序构建可运行开路故障工况的数字孪生体;结合实物系统采集数据,利用量子遗传算法实现数字孪生体关键器件参数同步及状态监测;对比数字孪生体与实物系统的电气量,提出单管开路故障诊断算法,实现开关器件晶体管、反并联二极管开路故障精准定位。算例仿真结果表明,所提出方法可实现器件精准状态监测及快速开路故障诊断。
As an important implementation form of energy router
solid-state transformer (SST) has broad application prospects in AC/DC distribution networks
energy distribution and control of microgrids
etc. In order to improve the operation stability of the SST and overcome the problem of “multi-device” state monitoring and “multi-switch” open-circuit fault location of the SST
the digital twin method of small SST state monitoring and single-tube open circuit fault diagnosis is proposed by using the high fidelity and interoperability of digital twins. This method uses electromagnetic transient program to build digital twins that can operate under open-circuit fault conditions. Combined with the data collected by the physical system
the quantum genetic algorithm is used to realize the parameter synchronization and state monitoring of the key components of the digital twins. By comparing the electrical quantities of digital twins and physical systems
a single-tube open-circuit fault diagnosis algorithm is proposed to accurately locate the open-circuit faults of switching device transistors and reverse parallel diodes. The simulation results of the case show that the proposed method can realize accurate state monitoring and fast open-circuit fault diagnosis for devices.
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