Due to the impacts of insulator flashover and mountain fire
the single-phase arc high-impedance grounding fault often occurs on the high-voltage transmission line with neutral point grounding. But up to now
only limited field fault data are available
which limits the correlative research of fault detection and protection. The experiment cost of artificial arc high-impedance grounding fault is high
so it is difficult to popularize the application. Based on the logarithmic arc model that can directly characterize the arcing V-I feature
this paper analyzes the difference between simulation data and record data. A data correction algorithm of the simulation model is proposed to solve the problem that the arcing V-I feature from the simulation model cannot reflect the difference between phase angles of V and I from the measured record data. The waveforms of corrected data have more similar external characteristics to the real record V-I curves
which provides data support for the follow-up study of arc high-impedance grounding fault.
Evaluation of Compound-disaster Failure Rate for Transmission Lines from Perspective of Whole Reductionism Thinking —Part Two Algorithm and Application
Evaluation of Compound-disaster Failure Rate for Transmission Lines from Perspective of Whole Reductionism Thinking —Part One Framework Design
Identification Method for Tree-contacting Grounding Fault of Medium-voltage Line Based on Long-term Variation Features of Zero-sequence Current
High-impedance Grounding Fault Detection Method for Distribution Network Considering Capacitor Switching Disturbance
Related Author
ZHANG Guangbin
SHU Banggui
SHU Hongchun
SI Dajun
XUE Yusheng
CHANG Kang
YU Chen
XUE Feng
Related Institution
Faculty of Electric Power Engineering, Kunming University of Science and Technology
Yunnan Grid Research Construction and Planning Center of Yunnan Power Grid Co., Ltd.
School of Electrical Engineering and Automation, Harbin Institute of Technology
State Grid Electric Power Research Institute (NARI Group Corporation)
School of Electrical and Electronic Engineering, Shandong University of Technology